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<meta content="This paper examines the interaction and impact on performance of two organizational mechanisms supporting generation and retention of knowledge: experience accumulation and experimentation. It provides evidence that generation of knowledge through experimentation and retention of knowledge through experience were significantly correlated with performance, whereas other measures of R&amp;D commitment and organization, including several suggested by prior studies, were not. It argues that experience and experimentation can function as at least partial substitutes for one another, possessing more of one, firms may need less of the other, and provides evidence that they were so in the semiconductor industry. The evolution of practice at one firm—Intel Corporation—is explored at greater length, providing a qualitative perspective on the process by which a shift towards greater experimentation occurred." name="eprints.abstract" />
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Semiconductor Processing, 2nd Edition. McGraw-Hill, New" name="eprints.referencetext" />
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    <h1 class="ep_tm_pagetitle">Experience, experimentation, and the accumulation of knowledge: the evolution of R&amp;D in the semiconductor industry</h1>
    <p style="margin-bottom: 1em" class="not_ep_block"><span class="person_name">West, Jonathan</span> and <span class="person_name">Iansiti, Marco</span> (2003) <xhtml:em>Experience, experimentation, and the accumulation of knowledge: the evolution of R&amp;D in the semiconductor industry.</xhtml:em> Research Policy, 32 (5). pp. 809-825. ISSN 0048-7333</p><p style="margin-bottom: 1em" class="not_ep_block"></p><table style="margin-bottom: 1em" class="not_ep_block"><tr><td valign="top" style="text-align:center"><a href="http://eprints.utas.edu.au/2683/1/Research_Policy-experience.pdf"><img alt="[img]" src="http://eprints.utas.edu.au/style/images/fileicons/application_pdf.png" class="ep_doc_icon" border="0" /></a></td><td valign="top"><a href="http://eprints.utas.edu.au/2683/1/Research_Policy-experience.pdf"><span class="ep_document_citation">PDF</span></a> - Full text restricted - Requires a PDF viewer<br />1131Kb</td><td><form method="get" accept-charset="utf-8" action="http://eprints.utas.edu.au/cgi/request_doc"><input accept-charset="utf-8" value="3672" name="docid" type="hidden" /><div class=""><input value="Request a copy" name="_action_null" class="ep_form_action_button" onclick="return EPJS_button_pushed( '_action_null' )" type="submit" /> </div></form></td></tr></table><p style="margin-bottom: 1em" class="not_ep_block">Official URL: <a href="http://dx.doi.org/10.1016/S0048-7333(02)00090-2">http://dx.doi.org/10.1016/S0048-7333(02)00090-2</a></p><div class="not_ep_block"><h2>Abstract</h2><p style="padding-bottom: 16px; text-align: left; margin: 1em auto 0em auto">This paper examines the interaction and impact on performance of two organizational mechanisms supporting generation and retention of knowledge: experience accumulation and experimentation. It provides evidence that generation of knowledge through experimentation and retention of knowledge through experience were significantly correlated with performance, whereas other measures of R&amp;D commitment and organization, including several suggested by prior studies, were not. It argues that experience and experimentation can function as at least partial substitutes for one another, possessing more of one, firms may need less of the other, and provides evidence that they were so in the semiconductor industry. The evolution of practice at one firm—Intel Corporation—is explored at greater length, providing a qualitative perspective on the process by which a shift towards greater experimentation occurred.</p></div><table style="margin-bottom: 1em" cellpadding="3" class="not_ep_block" border="0"><tr><th valign="top" class="ep_row">Item Type:</th><td valign="top" class="ep_row">Article</td></tr><tr><th valign="top" class="ep_row">Additional Information:</th><td valign="top" class="ep_row">The definitive version is available at http://www.sciencedirect.com&#13;
</td></tr><tr><th valign="top" class="ep_row">Keywords:</th><td valign="top" class="ep_row">Experience; Experimentation; Semiconductors</td></tr><tr><th valign="top" class="ep_row">Subjects:</th><td valign="top" class="ep_row"><a href="http://eprints.utas.edu.au/view/subjects/290000.html">290000 Engineering and Technology</a><br /><a href="http://eprints.utas.edu.au/view/subjects/350211.html">350000 Commerce, Management, Tourism and Services &gt; 350200 Business and Management &gt; 350211 Innovation and Technology Management</a></td></tr><tr><th valign="top" class="ep_row">ID Code:</th><td valign="top" class="ep_row">2683</td></tr><tr><th valign="top" class="ep_row">Deposited By:</th><td valign="top" class="ep_row"><span class="ep_name_citation"><span class="person_name">Miss Alexandra Lejda</span></span></td></tr><tr><th valign="top" class="ep_row">Deposited On:</th><td valign="top" class="ep_row">19 Dec 2007 12:16</td></tr><tr><th valign="top" class="ep_row">Last Modified:</th><td valign="top" class="ep_row">09 Jan 2008 02:30</td></tr><tr><th valign="top" class="ep_row">ePrint Statistics:</th><td valign="top" class="ep_row"><a target="ePrintStats" href="/es/index.php?action=show_detail_eprint;id=2683;">View statistics for this ePrint</a></td></tr></table><p align="right">Repository Staff Only: <a href="http://eprints.utas.edu.au/cgi/users/home?screen=EPrint::View&amp;eprintid=2683">item control page</a></p>
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